|SCI Journals||Conference/ proceedings
No. of Patents : Nil
Current Activity :
Surface and Interface study of various emerging materials (Magnetic tunnel junctions, Oxide heterostructures, CMR, Multiferroics, Solar Cells, LEDs etc.) using high resolution "Time of Flight Secondary Ion Mass Spectroscopy "TOF–SIMS).
Electronic structure of Transition Metal Oxide compounds, Topological Insulators, Thermoelectric Materials etc. using High Resolution Photoemission Spectroscopy.
Honours and Award :
Indo–US Research Fellowship award 2013 by Indo–US Science and Technology Forum (IUSSTF).
Doctoral fellowship from Institute of Physics, Bhubaneswar granted by Department of Atomic Energy (DAE), Govt. of India (2002 – 2009).
Any other information:
1. I am also Assistant Professor in "Academy of Scientific and Innovative Research (AcSIR)", CSIR–NPL campus, New Delhi.
Course Teaching: Fundamentals of Electronic Materials and Semiconductor Devices.
2. Performed Experiments/Training at various Labs. of international repute,
Synchrotron Radiation Center (SRC), Wisconsin, USA, November 2013.
ION TOF GmbH, Muenster Germany, June – July 2010.
ANKA Synchrotron, Karlsruhe, Germany, December 2007.
Elettra Synchrotron, Trieste Italy, July – August 2007.
Elettra Synchrotron, Trieste Italy, November 2005.
3. Professional Memberships :
Member of American Physical Society (APS), USA (2014).
Life member of Indian Society for Mass Spectrometry (ISMAS), Mumbai, India.
4. Some important talks delivered at various conferences :
Invited talk on " Surface and Interface study of Applied Materials using Time of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) " at Current Trends in Condensed Matter Physics, NISER Bhubaneswar during 19-22 February 2015.
Talk on " Valence band study of Sm0.1Ca0.9-x Srx MnO3 using high resolution photoemission spectroscopy " at American Physical Society (APS) meeting, March 3 – 7 2014, Denver, Colorado, USA.
Invited talk on "Surface and Interface analysis of materials using time of flight secondary ion mass spectrometry (TOF – SIMS)" in 12 ISMAS Triennial International Conference on Mass Spectrometry at Goa from 3 – 8 th March 2013.
Invited lecture on "Surface and Interface analysis of materials using TOF–SIMS" delivered in National Workshop on Advanced Materials Characterization Techniques held at NPL New Delhi during 10 – 13, July 2012 .