सी एस आर्इ आर - राष्ट्रीय भौतिक प्रयोगशाला में स्वागत है
भारत का राष्ट्रीय मापिकी संस्थान एवं भौतिक विज्ञान के क्षेत्र में एक अग्रणी अनुसंधान प्रयोगशाला
dalaimk@nplindia.org

Dr. Manas Kumar Dalai
Designation:
Scientist
Department:
Directorate (PME)
Email address:
abc..@nplindia.org
dalaimk
Brief Biodata:
  • DP/DU No.:

    DP/DU No. and Name: Electron and Ion Microscopy (SASD : 7.01.02)

    Current position:  Scientist
    Electron and Ion Microscopy Section
    CSIR–National Physical Laboratory,
    New Delhi – 110012, India

    Date of Birth: 01st June 1979

    Educational Qualifications:

  • DegreeSubjectUniversity/InstituteYear

    Ph. D

    Condensed Matter Physics

    Institute of Physics, Bhubaneswar

    2009

    M.Sc.

    Physics

    Utkal University, Bhubaneswar

    2001

    B. Sc

    Physics (H), Chemistry, Mathematics Utkal University, Bhubaneswar 1999

    Academics/Research Experience:
  • Year

    Duration

    Research field

    Institute ( in India/Abroad).

    Fellowship

    2009 – Till date

    October 2009 – Till date

    Spectroscopic study of advanced functional materials

    CSIR–National Physical laboratory, New Delhi

    Scientist

    2013–2014

    October 2013 – September 2014

    Spectroscopic study of Topological Insulators and Transition Metal Oxides

    Department of Physics, University of Illinois at Urbana-Champaign, USA

    Indo–US Research Fellowship

    2009

    June – September 2009

    Spectroscopy on transition metal compound

    University of Augsburg, Germany

    Post Doctoral

    2002 - 2009

    August 2002 – May 2009

    Electronic structure of Colossal Mgnetoresistive materials using various Electron Spectroscopic techniques.

    Institute of Physics, Bhubaneswar

    Ph. D Scholar

  • Date of Joining NPL: 06th October 2009
  • No. of Publications:
  • SCI JournalsConference/ proceedings BooksTotal
    28 2 0 30

    No. of Patents : Nil

    Current Activity :

    •  Surface and Interface study of various emerging materials (Magnetic tunnel junctions, Oxide heterostructures, CMR, Multiferroics, Solar Cells, LEDs etc.) using high resolution "Time of Flight Secondary Ion Mass Spectroscopy "TOF–SIMS).
    •  Electronic structure of Transition Metal Oxide compounds, Topological Insulators, Thermoelectric Materials etc. using High Resolution Photoemission Spectroscopy.

    Honours and Award :

    • Indo–US Research Fellowship award 2013 by Indo–US Science and Technology Forum (IUSSTF).
    • Doctoral fellowship from Institute of Physics, Bhubaneswar granted by Department of Atomic Energy (DAE), Govt. of India (2002 – 2009).
    • Qualified JEST–2002.
    • Qualified GATE–2001.

    Any other information:

    1.  I am also Assistant Professor in "Academy of Scientific and Innovative Research (AcSIR)", CSIR–NPL campus, New Delhi.

    Course Teaching: Fundamentals of Electronic Materials and Semiconductor Devices.

    2.  Performed Experiments/Training at various Labs. of international repute,

    •  Synchrotron Radiation Center (SRC), Wisconsin, USA, November 2013.

    •  ION TOF GmbH, Muenster Germany, June – July 2010.

    •  ANKA Synchrotron, Karlsruhe, Germany, December 2007.

    •  Elettra Synchrotron, Trieste Italy, July – August 2007.

    •  Elettra Synchrotron, Trieste Italy, November 2005.

    3.  Professional Memberships :

    •  Member of American Physical Society (APS), USA (2014).

    •  Life member of Indian Society for Mass Spectrometry (ISMAS), Mumbai, India.

    4.  Some important talks delivered at various conferences :

      •  Invited talk on " Surface and Interface study of Applied Materials using Time of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) " at Current Trends in Condensed Matter Physics, NISER Bhubaneswar during 19-22 February 2015.

      •  Talk on " Valence band study of Sm0.1Ca0.9-x Srx MnO3 using high resolution photoemission spectroscopy " at American Physical Society (APS) meeting, March 3 – 7 2014, Denver, Colorado, USA.

      •  Invited talk on "Surface and Interface analysis of materials using time of flight secondary ion mass spectrometry (TOF – SIMS)" in 12 ISMAS Triennial International Conference on Mass Spectrometry at Goa from 3 – 8 th March 2013.

      •  Invited lecture on "Surface and Interface analysis of materials using TOF–SIMS" delivered in National Workshop on Advanced Materials Characterization Techniques held at NPL New Delhi during 10 – 13, July 2012 .