|SCI Journals||Conference/ proceedings
No. of Patents : Nil
Current Activity :
Our current activity is characterisztion of materials using surface analytical techniques. To study the elements, isotopes and molecules present on the surface of the materials (Thin films, multilayers etc.) and their concentrations, We use time – of – flight secondary ion mass spectrometry (TOF – SIMS). Also we analyze the depth distribution of the elements, isotopes and molecules of the materials. Our group is using this techniques to study different materials for both academic as well as industrial purposes.
Photoemission is another surface science technique to study the electronic structure of the materials. We study the electronic structure of transition metal oxides using this technique.
Honours and Award :
Qualified GATE – 2001 and JEST – 2002