सीएसआईआर-राष्ट्रीय भौतिक प्रयोगशाला
CSIR-National Physical Laboratory
NPL Outreach for National Development (NPLONE)
About
CSIR NPL has developed a strong knowledge base, application base, and research infrastructure over the last 75+ years. The objective of this Research outreach programe is to make these facilities available to students across India for their research work.
For Information and Booking Please Contact:
Coordinator, NPLONE Program
CSIR- National Physical Laboratory,
Dr. K S Krishnan Marg,
New-Delhi-110012
Phone : 011-45608637
Email : npl-one@nplindia.res.in
CSIR-NPLONE Generic Instrument Facility
| S.No. | Equipment Name Growth/Characterization/Fabrication | Model/Make | Studies/ Measurements Offered | Tentative Proposed Price/ Sample for the Study, GST Extra | Sample Requirements for the Study | Remarks or any other Information |
|---|---|---|---|---|---|---|
| 1 | Confocal Microscope System with Photoluminescence Mapping | WiTec Confocal Microscope System alpha300 M+ alpha300 M+ Spectroscopy Function with Mapping Functionality for 375 nm, 980 nm and 1550 nm Excitation Wavelength | PL Spectroscopy Function with Mapping Functionality for 375 nm, 980 nm and 1550 nm Excitation Wavelength to examine PL Intensity distribution on the surface | Rs.1500/- per sample | Thin films/powder | Currently not working |
| 2 | Integrated Transient absorption. spectroscopy system with femtosecond lasers, power meter, OPA, spectrometer | COHERENT AND ULTRAFAST SYSTEMS | Transient Absorption and Z-scan | Rs.1500/- For Transient Absorption Rs.500 For Z-scan | thin films or liquid or samples which do not scatter laserlight | |
| 3 | VT 112 UHV SYSTEM FOR GROWTH AND ANALYSIS WITH AES LEED. | VARIAN | AES | Rs.500/- | semiconductor of metal films/wafers, | Need to provide 100 CF flange for one sample |
| 4 | IV/ CV measurement instrument | Keithley 4200 | V and CV measurement of thin film material & devices | Rs.1000 (For IV only) Rs.1500 (For both IV and CV) | with metal contacts | |
| 5 | Stress measurement set-up | FSM | Stress and radius of curvature of thin films | Rs.1500 | wafer 1 inch minimum, thin film on flexible substrate | |
| 6 | Spectroscopic Ellipsometry | M/s J. A. Woollam Co. Inc. | n.k,d (Thickness) wavelength range 200-800nm | Rs.1000 | Thin film (metals and semiconductors) | |
| 7 | Atomic Force Microscopy | M/s NT MDT-Solver P47- Pro | Surface morphology and Roughness analysis | Rs.1500 | 1cmx1cm thin film substrate | |
| 8 | Raman Spectrometer | Renishaw in Via Raman Reflex | Raman spectrum in 50-3200 wavenumber by 514 nm and/or 785 nm | Rs.1200 | Solid powder or film | |
| 9 | UV-VIS Spectrometer | Shimadzu | Absorption spectra of solution and films | Rs.500 | with details of solubility | |
| 10 | Four Point Probe/resistivity measurement System | Quad Pro, Lucas USA | Resistivity/conductivity measurement | Rs.1000/- per sample | semiconductor thin film/wafer2cmx2cm | |
| 11 | XRD-miniflex | Rigaku | Crystallographic structure and phase analysis | Rs.1000 | Powder and solid samples | |
| 12 | Rapid Thermal Processor | AS-one-150 | annealing of silicon samples only | Rs.1000 | silicon samples only | |
| 13 | Electrochemical Workstation | Autolab | Cyclic voltammetry and Frequency response analysis | Rs.1500 | Powder or paste | Electrolyte should be mentioned prior |
| 14 | LS-SS Luminuce speedo meter | PerkinElmer LS 55 | Fluorescence | Rs.500 | powder/solid materials | |
| 15 | Climate Chamber | SR labs | Rs.1000 | Size limitation 2feet | ||
| 16 | HPLC System | Varian | HPLC | Rs.1500 | Solvents | |
| 17 | Sinton lifetime measurement system | WCT120 | minority carrier lifetime of silicon | Rs.1000 | Silicon wafers (2″ min) | |
| 18 | Low Temp I-V Measurement | Charge transport | Rs.1500 | Metal electrode | Configuration device to be specified | |
| 19 | UV-Vis-NIR Spectrophotometer | Lambda1050 | Transmittance/Absorbance/Reflectance of sold/liquid materials | Rs.1000 | solid/liquid materials | |
| 20 | Solar Simulator | PET | Organic Solar cells I-V | Rs.1500 | Device | |
| 21 | Glove box with metalization | Jacomax | Fabrication of Organic devices in Inert medium | Rs.1500 | ||
| 22 | Modular Compact Rheometer | Anton-Paar MCR102 | Viscosity measurement of Newtonian and Non-Newtonian liquid | Rs.1000 per sample | Liquid | |
| 23 | Helium Leak detector | Adixen | Leak check in vacuum systems | Rs.500 | N/a | |
| 24 | J-V measurement system infaced with computer along with solar simulator | Kiethley | solar cell device parameters | Rs.1500/per device | Solar cell Device | Need to discuss before doing measurement |
| 25 | Glove box and Glove box accessories | MBRAUN | Organic Solar Cell device fabrication | Rs.1500/per device | all materials for the device fabrication | Need to discuss before device fabrication |
| 26 | Laser Scriber | ITO/FTO etching | Rs.1500/per sample | ITO/FTO | Need discussion | |
| 27 | Thermal evaporator | Electroding | Rs.1500/per run | Materials | ||
| 28 | Photoluminescence Spectrometer (PL) Equipped with Time-resolved measurement facility | Edinburgh Model No. F-900 | PL and Time-resolved measurement | Rs.500 | thin film /powder/liquid | |
| 29 | Thermal Evaporation | Mansha Vaccum equipment | metal and low melting material evaporation | Rs.1200 | material and substrate needs to be provided | |
| 30 | FTIR Spectrophotometer | Nicolet IS50/Thermofisher | optical properties (absorbance/transmission) 400-4000 cm-1 | Rs.500 per sample | powder samples or thin films | |
| 31 | UV Vis Spectrophotometer | Agilent Technologies | optical properties (absorbance/transmission) 400-4000 cm-1 | Rs.500 per sample | thin films on suitable substrate | |
| 32 | Field Emission Scanning Electron Microscope (FESEM) with Energy Dispersive spectroscopy(EDS) | TESCAN MAGNA, EDAX | Surface Morphology and Elemental analysis | FESEM :1500/- Plus GST and EDS :1000/- plus GST | Thin film/Bulk/pellet of size < 10 mm x 10 mm and height < 5 mm | Liquid samples will not be accepted |
| 33 | X-Ray Fluoroscence | Rigaku-ZSX; WD XRF | Composition analyses by qualitative method | Rs.1100 plus GST Extra | Pellest/wafers of size 10 mm dia or more | |
| 34 | Photoluminescence (PL) spectrometer | Perkin Elmer | PL studies | Rs.1000 plus GST Extra | powder, thin film and solution | |
| 35 | XRD | Rigaku (Ultima-IV) | 2theta vs Intensity | Rs.1000 per sample | pellet and powder | |
| 36 | Particle Size Analyzer | Mircotrac (blue-wave) | Particle Size Distribution (Micron Range) | Rs.500 per sample | powder | |
| 37 | DLS-Zetasizer | Malvern (Ultra) | Particle Size (Nano Range) | Rs.1000 for Particle Size/per sample | Liquids | |
| 38 | Thermal Evaporation | Vacuum technique | deposition of materials having low melting point | Rs.1200 | material needs to be provided | |
| 39 | Scanning Electron Microscope (SEM) with Energy Dispersive spectroscopy(EDS) | Zeiss EVO MA 10, Oxford INCA 250 | Surface Morphology and Elemental analysis | SEM :1000/- Plus GST and EDS :1000/- plus GST | Thin film/Bulk/pellet of size < 10 mm x 10 mm and height < 5 mm | Liquid samples will not be accepted |
| 40 | Oxygen plasma system | Europlasma | Substrate cleaning | i. Oxygen plasma treatment for 5min: Rs. 500/- | Transparent or opaque substrates | |
| 41 | Vibrating Sample Magnetometer (VSM) | Lakeshore, 7304 | MH & MT | i.)M-H (at room temperature) : Rs. 500/- (ii.)M-H (at above room temp. up to 700 K) : Rs. 1500/- (iii.)M-T Curve/Curie Temp. measurement (300 K-700K)) : Rs. 1500/- | Powder/pellet/thin film/liquid | Facility comes under Generic, Specialized & On-Call category (Case to case basis). Commercial users can utilize this facility via CFCT or BDG. |
| 42 | Probe station | Cascade Microtech | I V and photoconductivity measurements | IV measurements (1hr) : Rs 500/- | conducting or semiconducting | |
| 43 | Sputtering System | Excel instruments | Thin films (Au) deposition | Thin film (Au)< 100nm : Rs.1500/- | Flat, size < 1 cm | |
| 44 | Hall Effect Measurement Instrument | ECOPIA (HMS3000) | Hall effect studies | Rs.1000 per sample | optimised thin film and ohmic contacts to be provided by the user (system applicable to semiconducting samples only) | |
| 45 | Thermal evaporator | Hind high vacuum | Thin film coating of Cr, Au and Ag | Rs.1000/per deposition | Source material and the substrates to be provided by user | |
| 46 | High temperature Furnace | Nabertherm | Heat treatment of only oxides | Rs.500/hour | Only oxide powders, pellets or films. The oxides that may contaminate the furnace will not be entertained | |
| 47 | High Resolution X-ray Diffractometry | Panalytical | Single Crystal Rocking Curve | Rs.1000 | 5-10 mm | Crystal should be both side flat face |
| 48 | Mini spectrometer | Avaspec 3648/Avantes | Transmission, Reflection and Absorption | Rs.500 | Thin Films and Liquid Samples | |
| 49 | Surface Profiler | XP-200/Ambios | Thin Film Thickness | Rs.500 | There should be step on the surface of sample | |
| 50 | Photoluminescence (PL) spectrometer | Edinburg | Room temperature Photoluminescence | Rs.1000 per sample in the spectral range 230nm to 800nm | Min. 5 mm x 5 mm size for film, min 1 gm for for powder & min 3 mL for liquid |
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All Rights Reserved - The Official Website of CSIR-National Physical Laboratory, CSIR, under Ministry of S & T, Govt. of India
Site Designed & Managed by Knowledge Resource Centre
CSIR-NPL, New Delhi
India